語系:
繁體中文
English
說明(常見問題)
登入
Frontiers in electronic testing
書目資訊
essentials of electronic testing for...
essentials of electronic testing for digital, memory, and mixed-signal vlsi circuits
advances in electronic testing
advances in electronic testing
data mining and diagnosing ic fails
data mining and diagnosing ic fails
fault diagnosis of analog integrated...
fault diagnosis of analog integrated circuits
introduction to advanced system-on-c...
introduction to advanced system-on-chip test design and optimization
emerging nanotechnologies
emerging nanotechnologies
new methods of concurrent checking
new methods of concurrent checking
cmos sram circuit design and paramet...
cmos sram circuit design and parametric test in nano-scaled technologies
soft errors in modern electronic systems
soft errors in modern electronic systems
high performance memory testing
high performance memory testing
fault injection techniques and tools...
fault injection techniques and tools for embedded systems reliability evaluation
power-constrained testing of vlsi ci...
power-constrained testing of vlsi circuits
verification by error modeling :
verification by error modeling :
timing performance of nanometer digi...
timing performance of nanometer digital circuits under process variations
timing performance of nanometer digi...
timing performance of nanometer digital circuits under process variations
處理中
...
變更密碼[密碼必須為2種組合(英文和數字)及長度為10碼以上]
登入