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Stabilizing Perovskite Through Interface Modification.

Record Type:	Language materials, manuscript : Monograph/item
Title/Author:	Stabilizing Perovskite Through Interface Modification./
Author:	Thomas, Adam.
Description:	1 online resource (129 pages)
Notes:	Source: Dissertations Abstracts International, Volume: 85-04, Section: B.
Contained By:	Dissertations Abstracts International85-04B.
Subject:	Materials science. -
Online resource:	click for full text (PQDT)
ISBN:	9798380570282

Stabilizing Perovskite Through Interface Modification.
Thomas, Adam.

Stabilizing Perovskite Through Interface Modification. - 1 online resource (129 pages)

Source: Dissertations Abstracts International, Volume: 85-04, Section: B.

Thesis (Ph.D.)--State University of New York at Binghamton, 2023.

Includes bibliographical references

A study of improving the hybrid organic-inorganic interface is conducted. The use of an atomic layer deposited thin film oxides allows for direct surface modification of the perovskite. Using low-temperature processes with atomic force microscopy paired with electrochemical impedance spectroscopy and electrical tests the stability of the perovskite is measured. The perovskite's bulk stability is investigated by looking at the improvements of using bulky cations for 2D perovskite in 3D by mixing and by surface passivation.A thin film physical vapor deposition simulator is developed for parallel computing and discussed. The simulation allows for predicting thin film topology thickness and shadowing from both near and far features. The modeler is designed to run on graphics processors using a ray cast approach to model evaporation. The current iteration examines 2D profiles that may be obtained from cross-sections and FIB analysis.

Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2024

Mode of access: World Wide Web

ISBN: 9798380570282Subjects--Topical Terms:

557839
Materials science.
Subjects--Index Terms:

PerovskiteIndex Terms--Genre/Form:

554714
Electronic books.

Stabilizing Perovskite Through Interface Modification.
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500 $a Source: Dissertations Abstracts International, Volume: 85-04, Section: B.
500 $a Advisor: Mativetsky, Jeffrey;Dhakal, Tara.
502 $a Thesis (Ph.D.)--State University of New York at Binghamton, 2023.
504 $a Includes bibliographical references
520 $a A study of improving the hybrid organic-inorganic interface is conducted. The use of an atomic layer deposited thin film oxides allows for direct surface modification of the perovskite. Using low-temperature processes with atomic force microscopy paired with electrochemical impedance spectroscopy and electrical tests the stability of the perovskite is measured. The perovskite's bulk stability is investigated by looking at the improvements of using bulky cations for 2D perovskite in 3D by mixing and by surface passivation.A thin film physical vapor deposition simulator is developed for parallel computing and discussed. The simulation allows for predicting thin film topology thickness and shadowing from both near and far features. The modeler is designed to run on graphics processors using a ray cast approach to model evaporation. The current iteration examines 2D profiles that may be obtained from cross-sections and FIB analysis.
533 $a Electronic reproduction. $b Ann Arbor, Mich. : $c ProQuest, $d 2024
538 $a Mode of access: World Wide Web
650 4 $a Materials science. $3 557839
650 4 $a Physical chemistry. $3 1148725
650 4 $a Analytical chemistry. $3 1182118
653 $a Perovskite
653 $a Interface modification
653 $a Atomic layer
653 $a Thin film oxides
653 $a Electrochemical impedance
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690 $a 0486
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710 2 $a State University of New York at Binghamton. $b Materials Science and Engineering. $3 1469278
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