Languages
Kaczer, Ben.
Overview
| Works: | 1 works in 1 publications in 1 languages | |
|---|---|---|
Titles
Reliability of high mobility SiGe channel MOSFETs for future CMOS applications
by:
Franco, Jacopo.; Groeseneken, Guido.; SpringerLink (Online service); Kaczer, Ben.
(Language materials, printed)