Languages
          
        
        
      Takayama, Akari.
Overview
            | Works: | 2 works in 1 publications in 1 languages | |
|---|---|---|
Titles
          
                  
                    High-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films
                  
                  by: 
                  Takayama, Akari.; SpringerLink (Online service)
                  (Language materials, printed)
                  , [http://id.loc.gov/vocabulary/relators/aut]
                  
                
                  
                    High-resolution spin-resolved photoemission spectrometer and the Rashba effect in bismuth thin films
                  
                  by: 
                  SpringerLink (Online service); Takayama, Akari.
                  (Language materials, printed)
                  
                  
                
                
          Subjects
          
            
              
                Thin films.
              
            
              
                Interfaces (Physical sciences).
              
            
              
                Measurement Science and Instrumentation.
              
            
              
                Photoemission.
              
            
              
                Surfaces and Interfaces, Thin Films.
              
            
              
                Microscopy.
              
            
              
                Materials—Surfaces.
              
            
              
                Surface and Interface Science, Thin Films.
              
            
              
                Semiconductors.
              
            
              
                Physical measurements.
              
            
              
                Spectroscopy.
              
            
              
                Spectroscopy and Microscopy.
              
            
              
                Physics.
              
            
              
                Thin films
              
            
              
                Measurement   .
              
            
              
                Surfaces (Physics).