Wilson, Adam A.
概要
| 作品: | 2 作品在 0 項出版品 0 種語言 | |
|---|---|---|
書目資訊
Analysis of non-contact and contact probe-to-sample thermal exchange for quantitative measurements of thin film and nanostructure thermal conductivity by the scanning hot probe method.
by:
ProQuest Information and Learning Co.; Rensselaer Polytechnic Institute.; Wilson, Adam A.
(書目-語言資料,手稿)