Wilson, Adam A.
Overview
| Works: | 2 works in 0 publications in 0 languages | |
|---|---|---|
Titles
Analysis of non-contact and contact probe-to-sample thermal exchange for quantitative measurements of thin film and nanostructure thermal conductivity by the scanning hot probe method.
by:
ProQuest Information and Learning Co.; Rensselaer Polytechnic Institute.; Wilson, Adam A.
(Language materials, manuscript)