Languages
Claeys, Cor.
Overview
| Works: | 1 works in 1 publications in 1 languages | |
|---|---|---|
Titles
Metal impurities in silicon- and germanium-based technologies = origin, characterization, control, and device impact /
by:
Simoen, Eddy.; Claeys, Cor.; SpringerLink (Online service)
(Language materials, printed)
Metal Impurities in Silicon- and Germanium-Based Technologies = Origin, Characterization, Control, and Device Impact /
by:
Claeys, Cor.; SpringerLink (Online service); Simoen, Eddy.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/aut]
Subjects
Semiconductors
Electronic Circuits and Devices.
Optical materials.
Optical and Electronic Materials.
Semiconductors.
Characterization and Evaluation of Materials.
Metals
Optical engineering.
Microwaves, RF and Optical Engineering.
Microwaves.
Electronic circuits.
Materials science.
Electronic materials.