Beyerer, Jürgen.
概要
| 作品: | 1 作品在 0 項出版品 0 種語言 | |
|---|---|---|
書目資訊
Machine Learning for Cyber Physical Systems = Selected papers from the International Conference ML4CPS 2018 /
by:
SpringerLink (Online service); Kühnert, Christian.; Niggemann, Oliver.; Beyerer, Jürgen.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Machine Vision = Automated Visual Inspection: Theory, Practice and Applications /
by:
Frese, Christian.; Beyerer, Jürgen.; Puente León, Fernando.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/aut]
Machine Learning for Cyber Physical Systems = Selected papers from the International Conference ML4CPS 2020 /
by:
Maier, Alexander.; Beyerer, Jürgen.; SpringerLink (Online service); Niggemann, Oliver.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Machine Learning for Cyber Physical Systems = Selected papers from the International Conference ML4CPS 2015 /
by:
Beyerer, Jürgen.; Niggemann, Oliver.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Automatische Sichtprüfung = Grundlagen, Methoden und Praxis der Bildgewinnung und Bildauswertung /
by:
Frese, Christian.; Beyerer, Jürgen.; SpringerLink (Online service); Puente León, Fernando.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/aut]
Machine Learning for Cyber Physical Systems = Selected papers from the International Conference ML4CPS 2017 /
by:
SpringerLink (Online service); Niggemann, Oliver.; Maier, Alexander.; Beyerer, Jürgen.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
主題
Knowledge management.
Computer organization.
Computer engineering.
Image Processing and Computer Vision.
Signal, Image and Speech Processing.
Signal processing.
Robotics and Automation.
Electrical engineering.
Automation.
Communications Engineering, Networks.
Measurement .
Knowledge Management.
Computer Systems Organization and Communication Networks.
Image processing.
Speech processing systems.
Computational intelligence.
Data Mining and Knowledge Discovery.
Measurement Science and Instrumentation.
Data mining.
Physical measurements.
Computational Intelligence.
Internet of things.
Embedded computer systems.
Cyber-physical systems, IoT.
Robotics.
Optical data processing.