Guo, Jianqiu.
概要
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書目資訊
Analysis of Defect Structures in 4H Silicon Carbide Bulk Crystals, Epitaxial Layers and Power Devices.
by:
State University of New York at Stony Brook.; Guo, Jianqiu.; ProQuest Information and Learning Co.
(書目-語言資料,手稿)