Languages
Lu, Toh-Ming.
Overview
| Works: | 1 works in 3 publications in 1 languages | |
|---|---|---|
Titles
Evolution of Thin Film Morphology = Modeling and Simulations /
by:
SpringerLink (Online service); Pelliccione, Matthew.; Lu, Toh-Ming.
(Language materials, printed)
Rheed transmission mode and pole figures = thin film and nanostructure texture analysis /
by:
Wang, Gwo-Ching.; Lu, Toh-Ming.; SpringerLink (Online service)
(Language materials, printed)
Metal-dielectric interfaces in gigascale electronics = thermal and electrical stability /
by:
SpringerLink (Online service); Lu, Toh-Ming.; He, Ming.
(Language materials, printed)
Dielectric Breakdown in Gigascale Electronics = Time Dependent Failure Mechanisms /
by:
Plawsky, Joel.; SpringerLink (Online service); Lu, Toh-Ming.; Borja, Juan Pablo.
(Language materials, printed)
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Dielectric breakdown in gigascale electronics = time dependent failure mechanisms /
by:
Borja, Juan Pablo.; Lu, Toh-Ming.; SpringerLink (Online service); Plawsky, Joel.
(Language materials, printed)
Subjects
Electronics and Microelectronics, Instrumentation.
Nanotechnology and Microengineering.
Electrochemistry.
Optical materials.
Surfaces and Interfaces, Thin Films.
Surface and Interface Science, Thin Films.
Engineering.
Microelectronics
Interfaces (Physical sciences)
Electronic circuits.
Engineering Thermodynamics, Heat and Mass Transfer.
Materials Science.
Thin films
Crystal growth.
Electronic materials.
Chemistry.
Molecular beams.
Characterization and Evaluation of Materials.
Nanotechnology.
Tribology, Corrosion and Coatings.
Electronic Circuits and Devices.
Optical and Electronic Materials.