語系
          
        
        
      Quinten, Michael.
概要
            | 作品: | 1 作品在 2 項出版品 1 種語言 | |
|---|---|---|
書目資訊
          
                  
                    A Practical Guide to Surface Metrology
                  
                  by: 
                  Quinten, Michael.; SpringerLink (Online service)
                  (書目-語言資料,印刷品)
                  , [http://id.loc.gov/vocabulary/relators/aut]
                  
                
                
          主題
          
            
              
                Thin films.
              
            
              
                Photonics.
              
            
              
                Nanophotonics.
              
            
              
                Interfaces (Physical sciences).
              
            
              
                Materials—Surfaces.
              
            
              
                Surfaces and Interfaces, Thin Films.
              
            
              
                Physical measurements.
              
            
              
                Surface and Interface Science, Thin Films.
              
            
              
                Materials Engineering.
              
            
              
                Lasers.
              
            
              
                Nanoparticles
              
            
              
                Materials science.
              
            
              
                Optics, Lasers, Photonics, Optical Devices.
              
            
              
                Thin films
              
            
              
                Measurement   .
              
            
              
                Optical measurements.
              
            
              
                Surfaces (Physics).
              
            
              
                Characterization and Evaluation of Materials.
              
            
              
                Engineering—Materials.
              
            
              
                Measurement Science and Instrumentation.