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Defects in microelectronic materials...

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Schrimpf, Ronald Donald.

Defects in microelectronic materials and devices /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Defects in microelectronic materials and devices // edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf.
其他作者:	Schrimpf, Ronald Donald.
出版者:	Boca Raton, FL :CRC Press/Taylor & Francis Group, : c2009.,
面頁冊數:	xvi, 753 p. :ill. ; : 26 cm.;
標題:	Integrated circuits - Defects. -
電子資源:	http://www.loc.gov/catdir/toc/ecip0817/2008018722.html
ISBN:	9781420043761 :

Defects in microelectronic materials and devices /
Defects in microelectronic materials and devices /edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf. - Boca Raton, FL :CRC Press/Taylor & Francis Group,c2009. - xvi, 753 p. :ill. ;26 cm.

Includes bibliographical references and index.

ISBN: 9781420043761 :NT5197

LCCN: 2008018722Subjects--Topical Terms:

643385
Integrated circuits
--Defects.

LC Class. No.: TK7871 / .D44 2009

Dewey Class. No.: 621.381

Defects in microelectronic materials and devices /
LDR:00840cam a2200217 a 4500 001 615780
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020 $a 9781420043761 : $c NT5197
035 $a (OCoLC)ocn226308170
035 $a (OCoLC)226308170 $z (OCoLC)144523104
035 $a e 00031942
040 $a DLC $c DLC $d YDXCP $d UKM $d BTCTA $d BAKER $d C#P $d CDX $d BWX $d DLC $d NFU
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050 0 0 $a TK7871 $b .D44 2009
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245 0 0 $a Defects in microelectronic materials and devices / $c edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf.
260 # $a Boca Raton, FL : $c c2009. $b CRC Press/Taylor & Francis Group,
300 $a xvi, 753 p. : $b ill. ; $c 26 cm.
504 $a Includes bibliographical references and index.
650 # 0 $a Integrated circuits $x Defects. $3 643385
650 # 0 $a Metal oxide semiconductor field-effect transistors $x Testing. $3 643384
650 # 0 $a Microelectronics $x Materials $x Testing. $3 643383
700 1 # $a Schrimpf, Ronald Donald. $3 643388
700 1 # $a Pantelides, Sokrates T. $3 643387
700 1 # $a Fleetwood, D. M. $q (Dan M.) $3 867247
856 4 1 $3 Table of contents only $u http://www.loc.gov/catdir/toc/ecip0817/2008018722.html

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