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Photomodulated optical reflectance :...

Bogdanowicz, Janusz.

Photomodulated optical reflectance : = a fundamental study aimed at non-destructive carrier profiling in silicon /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Photomodulated optical reflectance :/ Janusz Bogdanowicz.
Reminder of title:	a fundamental study aimed at non-destructive carrier profiling in silicon /
Author:	Bogdanowicz, Janusz.
Published:	Berlin ;Springer, : c2012.,
Description:	xxiii, 201 p. :ill. ; : 25 cm.;
Notes:	"Doctoral thesis accepted by the University of Leuven, Belgium."--T.p.
Subject:	Silicon - Nondestructive testing. -
ISBN:	9783642301070 (Cloth) :

Photomodulated optical reflectance : = a fundamental study aimed at non-destructive carrier profiling in silicon /
Bogdanowicz, Janusz.

Photomodulated optical reflectance :a fundamental study aimed at non-destructive carrier profiling in silicon /Janusz Bogdanowicz. - Berlin ;Springer,c2012. - xxiii, 201 p. :ill. ;25 cm. - Springer theses.. - Springer theses..

"Doctoral thesis accepted by the University of Leuven, Belgium."--T.p.

Includes bibliographical references.

Introduction --

ISBN: 9783642301070 (Cloth) :NT3996Subjects--Topical Terms:

885096
Silicon
--Nondestructive testing.

LC Class. No.: TK7871.85 / .B64 2012

Dewey Class. No.: 537.6/226

Photomodulated optical reflectance : = a fundamental study aimed at non-destructive carrier profiling in silicon /
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020 $a 9783642301070 (Cloth) : $c NT3996
020 $a 364230107X (Cloth)
020 $a 3642301088 (electronic bk.)
020 $a 9783642301087 (electronic bk.)
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040 $a GW5XE $c GW5XE $d ZMC $d E7B $d COO $d CDX $d OCLCO $d OCLCQ $c NFU
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100 1 $a Bogdanowicz, Janusz. $3 885094
245 1 0 $a Photomodulated optical reflectance : $b a fundamental study aimed at non-destructive carrier profiling in silicon / $c Janusz Bogdanowicz.
260 $a Berlin ; $a New York : $c c2012. $b Springer,
300 $a xxiii, 201 p. : $b ill. ; $c 25 cm.
490 1 $a Springer theses.
500 $a "Doctoral thesis accepted by the University of Leuven, Belgium."--T.p.
504 $a Includes bibliographical references.
505 0 0 $t Introduction -- $t Theory of Perturbation of the Reflectance -- $t Theory of Perturbation of the Refractive Index -- $t Theory of Carrier and Heat Transport in Homogeneously Doped Silicon -- $t Extension of the Transport Theory to Ultra-Shallow Doped Silicon Layers -- $t Assessment of the Model -- $t Application of the Model to Carrier Profiling -- $t Conclusions and Recommendations.
650 0 $a Silicon $x Nondestructive testing. $3 885096
650 0 $a Silicon $x Optical properties. $3 782554
650 0 $a Semiconductors $x Testing $x Optical methods. $3 885095
830 0 $a Springer theses. $3 831604