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Structural, Syntactic, and Statistical Pattern Recognition = Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Structural, Syntactic, and Statistical Pattern Recognition/ edited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly.
Reminder of title:	Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings /
other author:	Torsello, Andrea.
Description:	XII, 378 p. 103 illus., 84 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Artificial intelligence. -
Online resource:	https://doi.org/10.1007/978-3-030-73973-7
ISBN:	9783030739737

Structural, Syntactic, and Statistical Pattern Recognition = Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings /
Structural, Syntactic, and Statistical Pattern RecognitionJoint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings /[electronic resource] :edited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly. - 1st ed. 2021. - XII, 378 p. 103 illus., 84 illus. in color.online resource. - Image Processing, Computer Vision, Pattern Recognition, and Graphics ;12644. - Image Processing, Computer Vision, Pattern Recognition, and Graphics ;9219.

Classification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

ISBN: 9783030739737

Standard No.: 10.1007/978-3-030-73973-7doiSubjects--Topical Terms:

559380
Artificial intelligence.

LC Class. No.: Q334-342

Dewey Class. No.: 006.3

Structural, Syntactic, and Statistical Pattern Recognition = Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings /
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