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Real time identification of local su...

Pradhan, Sourav.

Real time identification of local surface properties of material using atomic force microscope - An FPGA based implementation.

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Real time identification of local surface properties of material using atomic force microscope - An FPGA based implementation./
Author:	Pradhan, Sourav.
Published:	Ann Arbor : ProQuest Dissertations & Theses, : 2017,
Description:	66 p.
Notes:	Source: Masters Abstracts International, Volume: 56-03.
Contained By:	Masters Abstracts International56-03(E).
Subject:	Electrical engineering. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10258605
ISBN:	9781369680218

Real time identification of local surface properties of material using atomic force microscope - An FPGA based implementation.
Pradhan, Sourav.

Real time identification of local surface properties of material using atomic force microscope - An FPGA based implementation. - Ann Arbor : ProQuest Dissertations & Theses, 2017 - 66 p.

Source: Masters Abstracts International, Volume: 56-03.

Thesis (M.S.E.E.)--University of Minnesota, 2017.

System identification is widely employed for building mathematical models of manifold systems using statistical techniques. In this thesis, the application of system identification to atomic force microscopy using a real-time embedded solution has been reported. Atomic force microscopes are prevalent instruments utilized to explore material properties at the micro/nanometer level. A Field Programmable Gate Array has been chosen to harbor the design of the system identification module. The reported module has been successfully cascaded with an atomic force microscope to estimate local surface mechanical properties of materials. The design layout described in this thesis is not just applicable to commercially available atomic force microscopes, but to a large group of real-time signal processing units. Numerous simulations over multiple platforms and experimental results are presented to validate the accuracy and performance of the designed system identification module.

ISBN: 9781369680218Subjects--Topical Terms:

596380
Electrical engineering.

Real time identification of local surface properties of material using atomic force microscope - An FPGA based implementation.
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245 1 0 $a Real time identification of local surface properties of material using atomic force microscope - An FPGA based implementation.
260 1 $a Ann Arbor : $b ProQuest Dissertations & Theses, $c 2017
300 $a 66 p.
500 $a Source: Masters Abstracts International, Volume: 56-03.
500 $a Adviser: Murti V. Salapaka.
502 $a Thesis (M.S.E.E.)--University of Minnesota, 2017.
520 $a System identification is widely employed for building mathematical models of manifold systems using statistical techniques. In this thesis, the application of system identification to atomic force microscopy using a real-time embedded solution has been reported. Atomic force microscopes are prevalent instruments utilized to explore material properties at the micro/nanometer level. A Field Programmable Gate Array has been chosen to harbor the design of the system identification module. The reported module has been successfully cascaded with an atomic force microscope to estimate local surface mechanical properties of materials. The design layout described in this thesis is not just applicable to commercially available atomic force microscopes, but to a large group of real-time signal processing units. Numerous simulations over multiple platforms and experimental results are presented to validate the accuracy and performance of the designed system identification module.
590 $a School code: 0130.
650 4 $a Electrical engineering. $3 596380
690 $a 0544
710 2 $a University of Minnesota. $b Electrical Engineering. $3 1148492
773 0 $t Masters Abstracts International $g 56-03(E).
790 $a 0130
791 $a M.S.E.E.
792 $a 2017
793 $a English
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10258605

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