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Piezoresponse Force Microscopy Using Adaptive Contact-Mode Imaging.

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Piezoresponse Force Microscopy Using Adaptive Contact-Mode Imaging./
Author:	Waskar, Mohit.
Published:	Ann Arbor : ProQuest Dissertations & Theses, : 2019,
Description:	42 p.
Notes:	Source: Masters Abstracts International, Volume: 80-12.
Contained By:	Masters Abstracts International80-12.
Subject:	Mechanical engineering. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=13424843
ISBN:	9781392222003

Piezoresponse Force Microscopy Using Adaptive Contact-Mode Imaging.
Waskar, Mohit.

Piezoresponse Force Microscopy Using Adaptive Contact-Mode Imaging. - Ann Arbor : ProQuest Dissertations & Theses, 2019 - 42 p.

Source: Masters Abstracts International, Volume: 80-12.

Thesis (M.S.)--Rutgers The State University of New Jersey, School of Graduate Studies, 2019.

This item must not be sold to any third party vendors.

Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe tip scanning over a sample surface for obtaining data of the sample. Data acquisition is carried out by making physical contact with the surface of the sample, thus there is scope of characterizing data even beyond basic topology. Piezoresponse Force Microscopy (PFM) is just an extension of AFM imaging which is used for obtaining the piezoelectric response of the sample using the converse piezoelectric effect. Piezoelectric effect can be observed in almost all the materials around us which include biological and inorganic materials. PFM imaging is extensively used in the nanoscale characterization of ferroelectrics and its applications continue to grow. Thus, with the growing use of this technique, it is important to obtain images of high quality and at a faster rate to reduce the time required to image without affecting its accuracy. Research and experiments show that with the help of different algorithms and external control, the speed of AFM imaging can be boosted with reduced loss of data and higher accuracy. This research aims at applying existing control methodologies used in AFM imaging to the PFM imaging and analyzing the output by comparing images obtained at lower and higher speeds using different methods.

ISBN: 9781392222003Subjects--Topical Terms:

557493
Mechanical engineering.
Subjects--Index Terms:

Adaptive

Piezoresponse Force Microscopy Using Adaptive Contact-Mode Imaging.
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520 $a Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe tip scanning over a sample surface for obtaining data of the sample. Data acquisition is carried out by making physical contact with the surface of the sample, thus there is scope of characterizing data even beyond basic topology. Piezoresponse Force Microscopy (PFM) is just an extension of AFM imaging which is used for obtaining the piezoelectric response of the sample using the converse piezoelectric effect. Piezoelectric effect can be observed in almost all the materials around us which include biological and inorganic materials. PFM imaging is extensively used in the nanoscale characterization of ferroelectrics and its applications continue to grow. Thus, with the growing use of this technique, it is important to obtain images of high quality and at a faster rate to reduce the time required to image without affecting its accuracy. Research and experiments show that with the help of different algorithms and external control, the speed of AFM imaging can be boosted with reduced loss of data and higher accuracy. This research aims at applying existing control methodologies used in AFM imaging to the PFM imaging and analyzing the output by comparing images obtained at lower and higher speeds using different methods.
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