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Frontiers in electronic testing ;
書目資訊
new methods of concurrent checking
new methods of concurrent checking
cmos sram circuit design and paramet...
cmos sram circuit design and parametric test in nano-scaled technologies
fault injection techniques and tools...
fault injection techniques and tools for embedded systems reliability evaluation
power-constrained testing of vlsi ci...
power-constrained testing of vlsi circuits
verification by error modeling :
verification by error modeling :
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