Metal oxide semiconductor field-effect transistors - Reliability.

Reliability of high mobility SiGe channel MOSFETs for future CMOS applications by: (書目-語言資料,印刷品)

Strain-engineered MOSFETs / by: (書目-語言資料,印刷品)

Electronic Circuits and Devices.

Integrated circuits

Circuits and Systems.

Semiconductors.

Optical and Electronic Materials.

Strains and stresses.

Metal oxide semiconductor field-effect transistors

Metal oxide semiconductors, Complementary

Physics.