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Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures/ by Kanchan Manna, Jimson Mathew.
Author:	Manna, Kanchan.
other author:	Mathew, Jimson.
Description:	XII, 162 p. 31 illus., 8 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Electronic circuits. -
Online resource:	https://doi.org/10.1007/978-3-030-31310-4
ISBN:	9783030313104

Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures
Manna, Kanchan.

Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures[electronic resource] /by Kanchan Manna, Jimson Mathew. - 1st ed. 2020. - XII, 162 p. 31 illus., 8 illus. in color.online resource.

Introduction to Network-on-Chip Designs and Tests -- Iterative Mapping with Through Silicon Via (TSV) placement for 3D-NoC-based multicore systems -- A constructive Heuristic for integrated mapping and TSV Placement for 3D-NoC-based multicore systems -- Discrete Particle Swarm Optimization for integrated mapping and TSV Placement for 3D-NoC-based multicore systems -- Temperature-aware application mapping strategy for 2D-NoC-based multicore systems -- Temperature-aware design strategy for 3D-NoC-based multicore systems -- Temperature-aware test strategy for 2D as well as 3D-NoC-based multicore systems.

This book covers various aspects of optimization in design and testing of Network-on-Chip (NoC) based multicore systems. It gives a complete account of the state-of-the-art and emerging techniques for near optimal mapping and test scheduling for NoC-based multicores. The authors describe the use of the Integer Line Programming (ILP) technique for smaller benchmarks and a Particle Swarm Optimization (PSO) to get a near optimal mapping and test schedule for bigger benchmarks. The PSO-based approach is also augmented with several innovative techniques to get the best possible solution. The tradeoff between performance (communication or test time) of the system and thermal-safety is also discussed, based on designer specifications. Provides a single-source reference to design and test for circuit and system-level approaches to (NoC) based multicore systems; Gives a complete account of the state-of-the-art and emerging techniques for near optimal mapping and test scheduling in (NoC) based multicore systems; Organizes chapters systematically and hierarchically, rather than in an ad hoc manner, covering aspects of optimization in design and testing of Network-on-Chip (NoC) based multicore systems.

ISBN: 9783030313104

Standard No.: 10.1007/978-3-030-31310-4doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Design and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures
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