• X-ray structure analysis /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: X-ray structure analysis // Theo Siegrist.
    Author: Siegrist, Theo.
    Published: Berlin ;De Gruyter, : c2022.,
    Description: x, 239 p. :ill. (chiefly col.) ; : 24 cm.;
    Subject: X-ray crystallography. -
    ISBN: 3110610701 (pbk.)
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