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LSI/VLSI testability design

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Tsui, Frank F

LSI/VLSI testability design

Record Type:	Language materials, printed : monographic
Author:	TsuiFrank F,
Place of Publication:	s.l
Published:	McGraw-Hill Intl; McGraw-Hill Intl;
Year of Publication:	1988
Description:	pill : 22cm;

LSI/VLSI testability design
Tsui, Frank F

LSI/VLSI testability design / Frank F. Tsui - s.l : McGraw-Hill Intl, 1988. - p ; ill ; 22cm.

LSI/VLSI testability design
LDR:00426cam0 2200145 450 001 428784
010 1 $b (pbk.) $d NT
100 $a 19961021d1988 m y0engy01 b
101 0 $a eng
105 $a a z 001zy
200 1 $a LSI/VLSI testability design $f Frank F. Tsui
210 $a s.l $c McGraw-Hill Intl $d 1988 $c McGraw-Hill Intl
215 1 $a p $c ill $d 22cm
676 $a 621.395
676 $a 621.395 $b T882
700 $a Tsui $b Frank F $3 407583
801 0 $a cw $b 國立虎尾科技大學圖書館 $c 19961021 $g CCR

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2 records • Pages 1 •
1

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No. of reservations

E009959

圖書館3F 書庫

一般圖書(BOOK)

一般圖書

621.395 T882 1988

一般使用(Normal)

On shelf

0

E009958

圖書館3F 書庫

一般圖書(BOOK)

一般圖書

621.395 T882 1988 c.2

一般使用(Normal)

On shelf

0

2 records • Pages 1 •
1

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