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Digital circuit testing and testability

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Lala, Parag K

Digital circuit testing and testability

Record Type:	Language materials, printed : monographic
Author:	LalaParag K,
Place of Publication:	San Diego
Published:	Academic Press;
Year of Publication:	c1997
Description:	xii, 199 pill : 24 cm;
Subject:	Integrated circuits - Very large scale integration -
ISBN:	0124343309

Digital circuit testing and testability
Lala, Parag K

Digital circuit testing and testability / Parag K. Lala - San Diego : Academic Press, c1997. - xii, 199 p ; ill ; 24 cm.
Includes bibliographical references and index.
ISBN 0124343309
Integrated circuits -- Very large scale integration

Digital circuit testing and testability
LDR:00661cam 2200229 i 450 001 438031
005 20101024003336.0
009 a96042114
010 1 $6 30 $a 0124343309 $b (hard) $d NT
100 $a 20080130d1997 m y0engy01 b
101 0 $a eng
105 $a a z 001zy
200 1 $a Digital circuit testing and testability $f Parag K. Lala
210 $a San Diego $c Academic Press $d c1997
215 1 $a xii, 199 p $c ill $d 24 cm
320 $a Includes bibliographical references and index
606 $a Integrated circuits $x Very large scale integration $3 392457 $2 lc $3 725736
676 $a 621.3950287
676 $a 621.3950287 $b L193
676 $a 621.3950287 $v 20
680 $a TK7874.75 $b L35 1997
700 $a Lala $b Parag K $3 417598
801 0 $b DLC
801 0 $a cw $b BIB $c 19980123
801 1 $a cw $b national library $c 19980123

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621.3950287 L193 1997

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