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Proceedings of the Electrochemical S...

Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ((1997)

Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

Record Type:	Language materials, printed : monographic
Secondary Intellectual Responsibility:	Rai-ChoudhuryP,
Corporate Body:	Symposium on Diagnostic Techniques for Semiconductor Materials and Devices(1997
Alternative Intellectual Responsibility:	Electrochemical Society
Place of Publication:	Pennington, NJ
Published:	Electrochemical Society; Electrochemical Society;
Year of Publication:	c1997
Description:	ix, 478 pill : 23 cm;
Series:	ECS proceedings
Subject:	Semiconductors - Testing -
Notes:	"Sponsored by the Electrochemical Society, Inc., Electronics Division ... published in cooperation with: the International Society for Optical Engineering."
ISBN:	1566771390

Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices / editors, P. Rai-Choudhury ... [et al.] - Pennington, NJ : Electrochemical Society, c1997. - ix, 478 p ; ill ; 23 cm. - (ECS proceedings ; 97-12).
"Sponsored by the Electrochemical Society, Inc., Electronics Division ... published in cooperation with: the International Society for Optical Engineering.".
Includes bibliographical references and indexes.
ISBN 1566771390
Semiconductors -- Testing

Rai-Choudhury, P

Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
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