語系:
繁體中文
English
說明(常見問題)
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
Proceedings of the Electrochemical S...
~
Symposium on Diagnostic Techniques for Semiconductor Materials and Devices ((1997)
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
紀錄類型:
書目-語言資料,印刷品 : 單行本
其他作者:
Rai-ChoudhuryP,
團體作者:
Symposium on Diagnostic Techniques for Semiconductor Materials and Devices(1997
合作者:
Electrochemical Society
出版地:
Pennington, NJ
出版者:
Electrochemical Society; Electrochemical Society;
出版年:
c1997
面頁冊數:
ix, 478 pill : 23 cm;
集叢名:
ECS proceedings
標題:
Semiconductors - Testing -
附註:
"Sponsored by the Electrochemical Society, Inc., Electronics Division ... published in cooperation with: the International Society for Optical Engineering."
ISBN:
1566771390
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
/ editors, P. Rai-Choudhury ... [et al.] - Pennington, NJ : Electrochemical Society, c1997. - ix, 478 p ; ill ; 23 cm. - (ECS proceedings ; 97-12).
"Sponsored by the Electrochemical Society, Inc., Electronics Division ... published in cooperation with: the International Society for Optical Engineering.".
Includes bibliographical references and indexes.
ISBN 1566771390
Semiconductors -- Testing
Rai-Choudhury, P
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
LDR
:01067cam 2200229 i 450
001
442434
010
1
$
b(hard)
$a
1566771390
$d
NT
100
$a
20000814d1997 m y0engy01 b
101
0
$a
eng
105
$a
a a 101yy
200
1
$a
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
$f
editors, P. Rai-Choudhury ... [et al.]
210
$a
Pennington, NJ
$c
Electrochemical Society
$d
c1997
$c
Electrochemical Society
215
1
$a
ix, 478 p
$c
ill
$d
23 cm
225
2
$a
ECS proceedings
$v
97-12
225
2
$a
SPIE
$v
3322
300
$a
"Sponsored by the Electrochemical Society, Inc., Electronics Division ... published in cooperation with: the International Society for Optical Engineering."
320
$a
Includes bibliographical references and indexes
410
0
$1
2001
$a
ECS proceedings
$v
97-12
410
0
$1
2001
$a
SPIE
$v
3322
510
1
$a
Diagnostic techniques for semiconductor materials and devices
606
$2
lc
$a
Semiconductors
$x
Testing
$3
423151
676
$a
621.3815/2
$v
2100
680
$a
TK7871.85
$b
S954 199704
702
$a
Rai-Choudhury
$b
P
$3
423148
710
$a
Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
$e
Montreal, Quebec)
$f
(1997
$3
423149
711
$a
Electrochemical Society
$b
Electronics Division
$3
423150
801
0
$a
cw
$b
國立國立虎尾科技大學圖書館
$c
20000814
$g
CCR
筆 0 讀者評論
全部
圖書館3F 書庫
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
E019357
圖書館3F 書庫
一般圖書(BOOK)
一般圖書
621.38152 P963 1997
一般使用(Normal)
在架
0
預約
1 筆 • 頁數 1 •
1
評論
新增評論
分享你的心得
Export
取書館別
處理中
...
變更密碼[密碼必須為2種組合(英文和數字)及長度為10碼以上]
登入