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Data-driven methods for fault detect...

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Russell, Evan

Data-driven methods for fault detection and diagnosis in chemical processes

Record Type:	Language materials, printed : monographic
Author:	RussellEvan,
Secondary Intellectual Responsibility:	ChiangLeo H, 1975
Secondary Intellectual Responsibility:	BraatzRichard D, 1966
Place of Publication:	London
Published:	Springer;
Year of Publication:	2000
Description:	xiii, 192 pill : 25 cm;
Series:	Advances in industrial control
Subject:	Chemical process control -
Subject:	Fault location (Engineering) -
ISBN:	1852332581

Data-driven methods for fault detection and diagnosis in chemical processes
Russell, Evan

Data-driven methods for fault detection and diagnosis in chemical processes / Evan Russell, Leo H. Chiang and Richard D. Braatz - London : Springer, 2000. - xiii, 192 p ; ill ; 25 cm. - (Advances in industrial control).
Includes bibliographical references (p. [175]-187) and index.
ISBN 1852332581
Chemical process controlFault location (Engineering)

Chiang, Leo H

Data-driven methods for fault detection and diagnosis in chemical processes
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200 1 $a Data-driven methods for fault detection and diagnosis in chemical processes $f Evan Russell, Leo H. Chiang and Richard D. Braatz
210 $a London $c Springer $d 2000
215 0 $a xiii, 192 p $c ill $d 25 cm
225 2 $a Advances in industrial control
320 $a Includes bibliographical references (p. [175]-187) and index
410 0 $1 2001 $a Advances in industrial control
606 $a Chemical process control $3 419046 $2 lc $3 726579
606 $a Fault location (Engineering) $3 429978 $2 lc $3 731531
676 $a 660/.2815 $v 21
680 $a TP155.75 $b R87 2000
700 $a Russell $b Evan $3 429975
702 $a Chiang $b Leo H $f 1975 $3 429976
702 $a Braatz $b Richard D $f 1966 $3 429977
801 1 $a cw $b 國立虎尾科技大學圖書館圖書館 $c 20020118

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E021398

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660.2815 R962 2000

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