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Transmission electron microscopy and...

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Fultz, B

Transmission electron microscopy and diffractometry of materials

Record Type:	Language materials, printed : monographic
Author:	FultzB,
Secondary Intellectual Responsibility:	HoweJames M, 1955
Place of Publication:	Berlin
Published:	Springer;
Year of Publication:	c2002
Edition:	2nd ed
Description:	xxi, 748 pill : 25 cm;
Subject:	Materials - Microscopy -
Subject:	Transmission electron microscopy -
Subject:	X-ray diffractometer -
ISBN:	3540437649

Transmission electron microscopy and diffractometry of materials
Fultz, B

Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe - 2nd ed. - Berlin : Springer, c2002. - xxi, 748 p ; ill ; 25 cm.
Includes bibliographical references and index.
ISBN 3540437649
MaterialsTransmission electron microscopyX-ray diffractometer -- Microscopy

Howe, James M

Transmission electron microscopy and diffractometry of materials
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010 1 $3 688 $a 3540437649 $d NT
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101 0 $a eng
200 1 $a Transmission electron microscopy and diffractometry of materials $f Brent Fultz, James Howe
205 $a 2nd ed
210 $a Berlin $c Springer $d c2002
215 0 $a xxi, 748 p $c ill $d 25 cm
320 $a Includes bibliographical references and index
606 $a Materials $x Microscopy $3 440010 $2 lc $3 728912
606 $a Transmission electron microscopy $3 435648 $2 lc $3 728751
606 $a X-ray diffractometer $3 440011 $2 lc $3 740929
676 $a 620.1/1299 $v 21
680 $a TA417.23 $b F85 2002
700 $a Fultz $b B $3 411871
702 $a Howe $b James M $f 1955 $3 440009
801 0 $b DLC
801 0 $a cw $b BIB $c 20031027
801 1 $a cw $b 國立虎尾科技大學圖書館圖書館 $c 20031027

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620.11299 F974 2002

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