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Semiconductor material and device ch...

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Schroder, Dieter K

Semiconductor material and device characterization

Record Type:	Language materials, printed : monographic
Author:	SchroderDieter K,
Place of Publication:	New York
Published:	Wiley;
Year of Publication:	c1998
Edition:	2nd ed
Description:	xxiv, 760 pill : 25 cm;
Subject:	Semiconductors -
Subject:	Semiconductors - Testing -
Notes:	"A Wiley-Interscience publication."
ISBN:	0471241393

Semiconductor material and device characterization
Schroder, Dieter K

Semiconductor material and device characterization / Dieter K. Schroder - 2nd ed. - New York : Wiley, c1998. - xxiv, 760 p ; ill ; 25 cm.
"A Wiley-Interscience publication.".
Includes bibliographical references and index.
ISBN 0471241393
SemiconductorsSemiconductors -- Testing

Semiconductor material and device characterization
LDR:00676cam 2200217 i 450 001 480043
005 20101023214044.0
009 a97052094
010 1 $a 0471241393 $b (hbk. : alk. paper) $d NT
100 $a 20080130f 1998m y0engy01 b
101 0 $a eng
200 1 $a Semiconductor material and device characterization $f Dieter K. Schroder
205 $a 2nd ed
210 $a New York $c Wiley $d c1998
215 0 $a xxiv, 760 p $c ill $d 25 cm
300 $a "A Wiley-Interscience publication."
320 $a Includes bibliographical references and index
606 $a Semiconductors $3 398362 $2 lc $3 723660
606 $a Semiconductors $x Testing $3 423151 $2 lc $3 732292
676 $a 621.3815/2 $v 21
680 $a QC611 $b S335 1998
700 $a Schroder $b Dieter K $3 469988
801 0 $b DLC
801 0 $a cw $b BIB $c 20070124
801 1 $a cw $b 虎尾科技大學圖書館 $c 20070124

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621.38152 S381 1998

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