次微米級光學直度尺應用於精密掃描平台即時直度誤差補償之研究 = The ...
鄧聖耀

 

  • 次微米級光學直度尺應用於精密掃描平台即時直度誤差補償之研究 = The Study On Real-Time Straightness Error Compensation For A Linear Stage Using A Submicron Optical Straightness Measuring System
  • Record Type: Language materials, printed : monographic
    Paralel Title: The Study On Real-Time Straightness Error Compensation For A Linear Stage Using A Submicron Optical Straightness Measuring System
    Author: 鄧聖耀,
    Secondary Intellectual Responsibility: 劉建宏,
    Place of Publication: 雲林縣
    Published: 國立虎尾科技大學; 國立虎尾科技大學;
    Year of Publication: 2006,民95
    Edition: 初版
    Description: 69 面圖 : 30公分;
    Series: 光電與材料科技科技所
    Subject: 四象限檢測器
    Subject: 直度誤差
    Subject: 補償
    Subject: 角隅反射鏡
    Subject: Compensator
    Subject: Corner
    Subject: Quarter detector
    Subject: Straightness error
    Online resource: http://140.130.12.251/ETD-db/ETD-search-c/view_etd?URN=etd-0731106-120919
    Notes: 全文電子檔使用 校內校外均不公開
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T000136 國立虎尾科技大學 一般圖書(BOOK) 一般圖書 008.166M 1719 94 一般使用(Normal) On shelf 0
T000135 圖書館B1F 博碩士論文專區 不流通(NON_CIR) 碩士論文(TM) TM 008.166 1719 94 c.2 一般使用(Normal) On shelf 0
  • 2 records • Pages 1 •
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