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Atomic force microscopy, scanning ne...

Kaupp, G.

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces

Record Type:	Language materials, printed : monographic
Title Information:	application to rough and natural surfaces
Author:	KauppG.,
Place of Publication:	Berlin
Published:	Springer-Verlag;
Year of Publication:	c2006
Description:	xii, 292 p.ill. : 24 cm.;
Series:	Nanoscience and technology
Subject:	Near-field microscopy -
Subject:	Atomic force microscopy -
ISBN:	9783540284055

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
Kaupp, G.

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp - Berlin : Springer-Verlag, c2006. - xii, 292 p. ; ill. ; 24 cm.. - (Nanoscience and technology).
Includes bibliographical references and index.
ISBN 9783540284055ISBN 3540284052
Near-field microscopyAtomic force microscopy

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
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200 1 $a Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching $e application to rough and natural surfaces $f G. Kaupp
210 $a Berlin $d c2006 $c Springer-Verlag
215 1 $a xii, 292 p. $c ill. $d 24 cm.
225 2 $a Nanoscience and technology $x 1434-4904
320 $a Includes bibliographical references and index
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606 $a Atomic force microscopy $3 446075 $2 lc $3 742848
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680 $a QH212.A78 $b K38 2006
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