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Anomalous X-ray scattering for mater...

Waseda, Yoshio

Anomalous X-ray scattering for materials characterization : atomic-scale structure determination

紀錄類型:	書目-語言資料,印刷品 : 單行本
副題名:	atomic-scale structure determination
作者:	WasedaYoshio,
出版地:	Berlin
出版者:	Springer;
出版年:	c2002
面頁冊數:	xiii, 214 pll : 4 cm;
集叢名:	Springer tracts in modern physics
標題:	X-ray crystallography -
標題:	X-rays - Scattering -
ISBN:	3540434437

Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
Waseda, Yoshio

Anomalous X-ray scattering for materials characterization : atomic-scale structure determination / Yoshio Waseda - Berlin : Springer, c2002. - xiii, 214 p ; ll ; 4 cm. - (Springer tracts in modern physics ; v. 179).
Includes bibliographical references and index.
ISBN 3540434437
X-ray crystallographyX-rays -- Scattering

Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
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