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Anomalous X-ray scattering for mater...

Waseda, Yoshio

Anomalous X-ray scattering for materials characterization : atomic-scale structure determination

Record Type:	Language materials, printed : monographic
Title Information:	atomic-scale structure determination
Author:	WasedaYoshio,
Place of Publication:	Berlin
Published:	Springer;
Year of Publication:	c2002
Description:	xiii, 214 pll : 4 cm;
Series:	Springer tracts in modern physics
Subject:	X-ray crystallography -
Subject:	X-rays - Scattering -
ISBN:	3540434437

Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
Waseda, Yoshio

Anomalous X-ray scattering for materials characterization : atomic-scale structure determination / Yoshio Waseda - Berlin : Springer, c2002. - xiii, 214 p ; ll ; 4 cm. - (Springer tracts in modern physics ; v. 179).
Includes bibliographical references and index.
ISBN 3540434437
X-ray crystallographyX-rays -- Scattering

Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
LDR:00697nam 2200205 450 001 500583
005 20130306110806.0
009 a12891055
010 1 $a 3540434437 $b (hbk.) $d EUR164.9
100 $a 20080130
101 0 $a eng
200 1 $a Anomalous X-ray scattering for materials characterization $e atomic-scale structure determination $f Yoshio Waseda
210 $a Berlin $d c2002 $c Springer
215 0 $a xiii, 214 p $c ll $d 4 cm
225 0 $a Springer tracts in modern physics $v v. 179 $x 0081-3869
320 $a Includes bibliographical references and index
606 $a X-ray crystallography $3 421023 $2 lc $3 724549
606 $a X-rays $x Scattering $3 444486 $2 lc $3 737151
676 $a 539 s $v 21
680 $a QC1 $b S797 vol. 179
700 $a Waseda $b Yoshio $3 493366
801 0 $b DLC
801 0 $a cw $b CHI $c 20071127
801 1 $a cw $b 虎尾科技大學圖書館 $c 20071127