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Logic testing and design for testability

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Fujiwara, Hideo

Logic testing and design for testability

Record Type:	Language materials, printed : monographic
Author:	FujiwaraHideo,
Place of Publication:	s.l
Published:	s.n; s.n;
Description:	x,284pill : 23cm;

Logic testing and design for testability
Fujiwara, Hideo

Logic testing and design for testability / Hideo Fujiwara - s.l : s.n - x,284p ; ill ; 23cm.

Logic testing and design for testability
LDR:00351cam 2200133 450 001 537333
010 1 $2 80 $d NT
100 $a 19940628d m y0engy01 b
101 0 $a eng
102 $a us
105 $a a z 000zy
200 1 $a Logic testing and design for testability $f Hideo Fujiwara
210 $a s.l $c s.n $c s.n
215 1 $a x,284p $c ill $d 23cm
676 $a 621.381548
700 $a Fujiwara $b Hideo $3 521304

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Items

1 records • Pages 1 •
1

Inventory Number

No. of reservations

E006164

圖書館3F 書庫

一般圖書(BOOK)

一般圖書

621.381548 F961

一般使用(Normal)

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1 records • Pages 1 •
1

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