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Micromanufacturing : international r...
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Ehmann, K. F.
Micromanufacturing : international research and development
Record Type:
Language materials, printed : monographic
Title Information:
international research and development
Alternative Intellectual Responsibility:
EhmannK. F.,
Place of Publication:
Dordrecht
Published:
Springer;
Year of Publication:
c2007.
Description:
xxxiv, 362 p.ill. : 25 cm.;
Subject:
Microfabrication. -
Subject:
Micromachining. -
Online resource:
http://www.loc.gov/catdir/enhancements/fy0825/2007425771-d.html
Online resource:
http://www.loc.gov/catdir/enhancements/fy0825/2007425771-t.html
Notes:
"WTEC"--Cover.
Content Note:
Introduction / Richard E. DeVor and Kornel F. Ehmann -- Design / Martin L. Culpepper and Thomas R. Kurfess -- Materials / David Bourell and Kamlakar Rajurkar -- Processes / Kamlakar Rajurkar and Marc Madou -- Metrology, sensors and control / Thomas R. Kurfess and Thom J. Hodgson -- Non-lithography applications / Marc Madou -- Business, education, the environment, and other issues / Thom J. Hodgson.
Micromanufacturing : international research and development
Micromanufacturing
: international research and development / by K.F. Ehmann ... [et al.]. - Dordrecht : Springer, c2007.. - xxxiv, 362 p. ; ill. ; 25 cm..
Introduction / Richard E. DeVor and Kornel F. Ehmann -- Design / Martin L. Culpepper and Thomas R. Kurfess -- Materials / David Bourell and Kamlakar Rajurkar -- Processes / Kamlakar Rajurkar and Marc Madou -- Metrology, sensors and control / Thomas R. Kurfess and Thom J. Hodgson -- Non-lithography applications / Marc Madou -- Business, education, the environment, and other issues / Thom J. Hodgson..
"WTEC"--Cover.Includes bibliographical references..
ISBN 1402059493ISBN 9781402059490ISBN 1402059485ISBN 9781402059483
Microfabrication.Micromachining.
Ehmann, K. F.
Micromanufacturing : international research and development
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Introduction / Richard E. DeVor and Kornel F. Ehmann -- Design / Martin L. Culpepper and Thomas R. Kurfess -- Materials / David Bourell and Kamlakar Rajurkar -- Processes / Kamlakar Rajurkar and Marc Madou -- Metrology, sensors and control / Thomas R. Kurfess and Thom J. Hodgson -- Non-lithography applications / Marc Madou -- Business, education, the environment, and other issues / Thom J. Hodgson.
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