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Fault detectability in DWDM = toward...

Kartalopoulos, Stamatios V.

Fault detectability in DWDM = toward higher signal quality & system reliability /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Fault detectability in DWDM/ Stamatios V. Kartalopoulos.
Reminder of title:	toward higher signal quality & system reliability /
Author:	Kartalopoulos, Stamatios V.
Published:	New York :IEEE Press, : 2001.,
Description:	1 online resource (xx, 156 p.) :ill. :
Subject:	Optical communications. -
Online resource:	http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624
ISBN:	9780470544617

Fault detectability in DWDM = toward higher signal quality & system reliability /
Kartalopoulos, Stamatios V.

Fault detectability in DWDMtoward higher signal quality & system reliability /[electronic resource] :Stamatios V. Kartalopoulos. - New York :IEEE Press,2001. - 1 online resource (xx, 156 p.) :ill.

Includes bibliographical references and index.

ISBN: 9780470544617

Source: 9780470544617IEEEhttp://ieeexplore.ieee.orgSubjects--Topical Terms:

572663
Optical communications.
Index Terms--Genre/Form:

554714
Electronic books.

LC Class. No.: TK5103.59 / .K34 2001

Dewey Class. No.: 621.382/7

Fault detectability in DWDM = toward higher signal quality & system reliability /
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020 $a 9780470544617
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029 1 $a GBVCP $b 714994790
035 $a (OCoLC)557449105 $z (OCoLC)609033413
035 $a ocn557449105
037 $a 9780470544617 $b IEEE $n http://ieeexplore.ieee.org
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050 4 $a TK5103.59 $b .K34 2001
082 0 4 $a 621.382/7 $2 22
100 1 $a Kartalopoulos, Stamatios V. $3 677198
245 1 0 $a Fault detectability in DWDM $h [electronic resource] : $b toward higher signal quality & system reliability / $c Stamatios V. Kartalopoulos.
260 $a New York : $b IEEE Press, $c 2001.
300 $a 1 online resource (xx, 156 p.) : $b ill.
504 $a Includes bibliographical references and index.
588 $a Description based on print version record.
650 0 $a Optical communications. $3 572663
650 0 $a Wavelength division multiplexing. $3 670941
650 0 $a Signal processing $x Digital techniques. $3 556357
650 0 $a Fault location (Engineering) $3 636512
655 4 $a Electronic books. $2 local $3 554714
856 4 0 $3 IEEE Xplore $u http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624
994 $a 92 $b TWHIS

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