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Electromigration modeling at circuit...
~
He, Feifei.
Electromigration modeling at circuit layout level
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Electromigration modeling at circuit layout level/ by Cher Ming Tan, Feifei He.
Author:
Tan, Cher Ming.
other author:
He, Feifei.
Published:
Singapore :Springer Singapore : : 2013.,
Description:
x, 103 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Integrated circuits - Reliability. -
Online resource:
http://dx.doi.org/10.1007/978-981-4451-21-5
ISBN:
9789814451215 (electronic bk.)
Electromigration modeling at circuit layout level
Tan, Cher Ming.
Electromigration modeling at circuit layout level
[electronic resource] /by Cher Ming Tan, Feifei He. - Singapore :Springer Singapore :2013. - x, 103 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology. Reliability,2191-530X. - SpringerBriefs in applied sciences and technology.Reliability..
ISBN: 9789814451215 (electronic bk.)Subjects--Topical Terms:
598323
Integrated circuits
--Reliability.
LC Class. No.: TK7874 / .T36 2013
Dewey Class. No.: 621.3815
Electromigration modeling at circuit layout level
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Engineering (Springer-11647)
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