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Soft error mechanisms, modeling and mitigation

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Soft error mechanisms, modeling and mitigation/ by Selahattin Sayil.
Author:	Sayil, Selahattin.
Published:	Cham :Springer International Publishing : : 2016.,
Description:	xi, 105 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Soft errors (Computer science) -
Online resource:	http://dx.doi.org/10.1007/978-3-319-30607-0
ISBN:	9783319306070

Soft error mechanisms, modeling and mitigation
Sayil, Selahattin.

Soft error mechanisms, modeling and mitigation[electronic resource] /by Selahattin Sayil. - Cham :Springer International Publishing :2016. - xi, 105 p. :ill., digital ;24 cm.

Introduction -- Mitigation of Single Event Effects -- Transmission Gate (TG) Based Soft Error Mitigation Methods -- Single Event Soft Error Mechanisms -- Modeling Single Event Crosstalk Noise in Nanometer Technologies -- Modeling of Single Event Coupling Delay and Speedup Effects -- Single Event Upset Hardening of Interconnects -- Soft-Error Aware Power Optimization -- Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

ISBN: 9783319306070

Standard No.: 10.1007/978-3-319-30607-0doiSubjects--Topical Terms:

1106021
Soft errors (Computer science)

LC Class. No.: TK5102.96

Dewey Class. No.: 005.717

Soft error mechanisms, modeling and mitigation
LDR:02434nam a2200313 a 4500 001 862578
003 DE-He213
005 20160824105242.0
006 m d
007 cr nn 008maaau
008 170720s2016 gw s 0 eng d
020 $a 9783319306070 $q (electronic bk.)
020 $a 9783319306063 $q (paper)
024 7 $a 10.1007/978-3-319-30607-0 $2 doi
035 $a 978-3-319-30607-0
040 $a GP $c GP
041 0 $a eng
050 4 $a TK5102.96
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
082 0 4 $a 005.717 $2 23
090 $a TK5102.96 $b .S274 2016
100 1 $a Sayil, Selahattin. $3 1106020
245 1 0 $a Soft error mechanisms, modeling and mitigation $h [electronic resource] / $c by Selahattin Sayil.
260 $a Cham : $c 2016. $b Springer International Publishing : $b Imprint: Springer,
300 $a xi, 105 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction -- Mitigation of Single Event Effects -- Transmission Gate (TG) Based Soft Error Mitigation Methods -- Single Event Soft Error Mechanisms -- Modeling Single Event Crosstalk Noise in Nanometer Technologies -- Modeling of Single Event Coupling Delay and Speedup Effects -- Single Event Upset Hardening of Interconnects -- Soft-Error Aware Power Optimization -- Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.
520 $a This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
650 0 $a Soft errors (Computer science) $3 1106021
650 0 $a Error-correcting codes (Information theory) $3 568233
650 1 4 $a Engineering. $3 561152
650 2 4 $a Circuits and Systems. $3 670901
650 2 4 $a Electronic Circuits and Devices. $3 782968
650 2 4 $a Processor Architectures. $3 669787
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-30607-0
950 $a Engineering (Springer-11647)