國立虎尾科技大學 |

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits

Record Type:	Language materials, printed : Monograph/item
Title/Author:	On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits/ by Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan.
Author:	Cui, Qiang.
other author:	Liou, Juin J.
Description:	XVII, 86 p. 59 illus., 42 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Electronic circuits. -
Online resource:	https://doi.org/10.1007/978-3-319-10819-3
ISBN:	9783319108193

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
Cui, Qiang.

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits[electronic resource] /by Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan. - 1st ed. 2015. - XVII, 86 p. 59 illus., 42 illus. in color.online resource.

Basics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.

This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.

ISBN: 9783319108193

Standard No.: 10.1007/978-3-319-10819-3doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
LDR:02856nam a22003975i 4500 001 968433
003 DE-He213
005 20200701002412.0
007 cr nn 008mamaa
008 201211s2015 gw | s |||| 0|eng d
020 $a 9783319108193 $9 978-3-319-10819-3
024 7 $a 10.1007/978-3-319-10819-3 $2 doi
035 $a 978-3-319-10819-3
050 4 $a TK7888.4
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
100 1 $a Cui, Qiang. $e author. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1264058
245 1 0 $a On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits $h [electronic resource] / $c by Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan.
250 $a 1st ed. 2015.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2015.
300 $a XVII, 86 p. 59 illus., 42 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Basics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.
520 $a This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.
650 0 $a Electronic circuits. $3 563332
650 0 $a Electronics. $3 596389
650 0 $a Microelectronics. $3 554956
650 1 4 $a Circuits and Systems. $3 670901
650 2 4 $a Electronic Circuits and Devices. $3 782968
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
700 1 $a Liou, Juin J. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1129809
700 1 $a Hajjar, Jean-Jacques. $e author. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1264059
700 1 $a Salcedo, Javier. $e author. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1264060
700 1 $a Zhou, Yuanzhong. $e author. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1264061
700 1 $a Srivatsan, Parthasarathy. $e author. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1264062
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783319108186
776 0 8 $i Printed edition: $z 9783319108209
776 0 8 $i Printed edition: $z 9783319358246
856 4 0 $u https://doi.org/10.1007/978-3-319-10819-3
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)