Degradation
Overview
Works: | 1 works in 1 publications in 1 languages |
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Titles
65nm窄寬度MOSFETs於升溫下之通道熱載子可靠度探討 = = Channel-Hot-Carrier Effect on 65 nm Wide/Narrow Width MOSFETs with Temperature Variations /
by:
(Language materials, printed)
Subjects