Joy, David C.

概要

作品:	0 作品在 1 項出版品 1 種語言

書目資訊

Helium ion microscopy = principles and applications / by: Joy, David C.; SpringerLink (Online service) (書目-語言資料,印刷品)

Scanning Electron Microscopy and X-Ray Microanalysis by: Goldstein, Joseph I.; Newbury, Dale E.; SpringerLink (Online service); Joy, David C.; Michael, Joseph R.; Scott, John Henry J.; Ritchie, Nicholas W.M. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/aut]

主題

Ion bombardment. Field ion microscopy. Measurement Science and Instrumentation. Microscopy. Physical measurements. Spectroscopy. Helium ions. Spectroscopy and Microscopy. Nanoscale Science and Technology. Materials science. Biological Microscopy. Materials Science. Spectroscopy/Spectrometry. Measurement . Characterization and Evaluation of Materials. Nanotechnology.