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Helium ion microscopy = principles a...
~
Joy, David C.
Helium ion microscopy = principles and applications /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Helium ion microscopy/ by David C. Joy.
其他題名:
principles and applications /
作者:
Joy, David C.
出版者:
New York, NY :Springer New York : : 2013.,
面頁冊數:
viii, 64 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Field ion microscopy. -
電子資源:
http://dx.doi.org/10.1007/978-1-4614-8660-2
ISBN:
9781461486602 (electronic bk.)
Helium ion microscopy = principles and applications /
Joy, David C.
Helium ion microscopy
principles and applications /[electronic resource] :by David C. Joy. - New York, NY :Springer New York :2013. - viii, 64 p. :ill., digital ;24 cm. - SpringerBriefs in materials,2192-1091. - SpringerBriefs in materials..
ISBN: 9781461486602 (electronic bk.)Subjects--Topical Terms:
1078432
Field ion microscopy.
Dewey Class. No.: 578.1
Helium ion microscopy = principles and applications /
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