Joy, David C.

Overview

Works:	0 works in 1 publications in 1 languages

Titles

Helium ion microscopy = principles and applications / by: Joy, David C.; SpringerLink (Online service) (Language materials, printed)

Scanning Electron Microscopy and X-Ray Microanalysis by: Goldstein, Joseph I.; Newbury, Dale E.; SpringerLink (Online service); Joy, David C.; Michael, Joseph R.; Scott, John Henry J.; Ritchie, Nicholas W.M. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/aut]

Subjects

Ion bombardment. Field ion microscopy. Measurement Science and Instrumentation. Microscopy. Physical measurements. Spectroscopy. Helium ions. Spectroscopy and Microscopy. Nanoscale Science and Technology. Materials science. Biological Microscopy. Materials Science. Spectroscopy/Spectrometry. Measurement . Characterization and Evaluation of Materials. Nanotechnology.