Seo, Hyungtak.
概要
| 作品: | 1 作品在 0 項出版品 0 種語言 | |
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書目資訊
Characterization of high -k dielectrics and interfaces on device reliability.
by:
ProQuest Information and Learning Co.; North Carolina State University.; Seo, Hyungtak.
(書目-語言資料,手稿)