書封
Sclaroff, Stan.
概要
| 作品: | 0 作品在 0 項出版品 0 種語言 | |
|---|---|---|
書目資訊
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part III /
by:
Del Bimbo, Alberto.; Mei, Tao.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Farinella, Giovanni Maria.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VIII /
by:
Del Bimbo, Alberto.; Mei, Tao.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Farinella, Giovanni Maria.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VII /
by:
Mei, Tao.; Del Bimbo, Alberto.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part II /
by:
Distante, Cosimo.; Leo, Marco.; Farinella, Giovanni M.; Tombari, Federico.; SpringerLink (Online service); Sclaroff, Stan.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part I /
by:
Mei, Tao.; Del Bimbo, Alberto.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part III /
by:
Leo, Marco.; Distante, Cosimo.; Farinella, Giovanni M.; Sclaroff, Stan.; Tombari, Federico.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part II /
by:
Mei, Tao.; Del Bimbo, Alberto.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part IV /
by:
Mei, Tao.; Del Bimbo, Alberto.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing. ICIAP 2022 Workshops = ICIAP International Workshops, Lecce, Italy, May 23–27, 2022, Revised Selected Papers, Part I /
by:
Mazzeo, Pier Luigi.; Distante, Cosimo.; SpringerLink (Online service); Sclaroff, Stan.; Frontoni, Emanuele.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part I /
by:
SpringerLink (Online service); Tombari, Federico.; Sclaroff, Stan.; Farinella, Giovanni M.; Leo, Marco.; Distante, Cosimo.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing. ICIAP 2022 Workshops = ICIAP International Workshops, Lecce, Italy, May 23–27, 2022, Revised Selected Papers, Part II /
by:
Distante, Cosimo.; Mazzeo, Pier Luigi.; Frontoni, Emanuele.; Sclaroff, Stan.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Visual Saliency: From Pixel-Level to Object-Level Analysis
by:
Malmberg, Filip.; Zhang, Jianming.; Sclaroff, Stan.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/aut]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part VI /
by:
Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.; Mei, Tao.; Del Bimbo, Alberto.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part V /
by:
Mei, Tao.; Del Bimbo, Alberto.; SpringerLink (Online service); Sclaroff, Stan.; Farinella, Giovanni Maria.; Cucchiara, Rita.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
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主題
Computer science—Mathematics.
Computer Application in Social and Behavioral Sciences.
Computer engineering.
Pattern recognition systems.
Image Processing and Computer Vision.
Signal, Image and Speech Processing.
Artificial intelligence.
Automated Pattern Recognition.
Computer Communication Networks.
Computers and Education.
Signal processing.
Machine learning.
Education—Data processing.
Information Systems Applications (incl. Internet).
Mathematics of Computing.
Image Processing.
Computer Vision.
Speech processing systems.
Computer vision.
Computer and Information Systems Applications.
Computer Engineering and Networks.
Computer communication systems.
Application software.
Artificial Intelligence.
Data mining.
Social sciences—Data processing.
Machine Learning.
Computing Milieux.
Optical data processing.
Computers.
Image processing.
Computer Imaging, Vision, Pattern Recognition and Graphics.
Image processing—Digital techniques.
Data Mining and Knowledge Discovery.
Computer networks .