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Sclaroff, Stan.

Overview
Works: 1 works in 0 publications in 0 languages
Titles
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part III / by: Del Bimbo, Alberto.; Mei, Tao.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Farinella, Giovanni Maria. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VIII / by: Del Bimbo, Alberto.; Mei, Tao.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Farinella, Giovanni Maria.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VII / by: Mei, Tao.; Del Bimbo, Alberto.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part II / by: Distante, Cosimo.; Leo, Marco.; Farinella, Giovanni M.; Tombari, Federico.; SpringerLink (Online service); Sclaroff, Stan. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part I / by: Mei, Tao.; Del Bimbo, Alberto.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part III / by: Leo, Marco.; Distante, Cosimo.; Farinella, Giovanni M.; Sclaroff, Stan.; Tombari, Federico.; SpringerLink (Online service) (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part II / by: Mei, Tao.; Del Bimbo, Alberto.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part IV / by: Mei, Tao.; Del Bimbo, Alberto.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing. ICIAP 2022 Workshops = ICIAP International Workshops, Lecce, Italy, May 23–27, 2022, Revised Selected Papers, Part I / by: Mazzeo, Pier Luigi.; Distante, Cosimo.; SpringerLink (Online service); Sclaroff, Stan.; Frontoni, Emanuele. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part I / by: SpringerLink (Online service); Tombari, Federico.; Sclaroff, Stan.; Farinella, Giovanni M.; Leo, Marco.; Distante, Cosimo. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]
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