Lee, Jack C.
概要
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書目資訊
Hf-Based High-k Dielectrics = Process Development, Performance Characterization, and Reliability /
by:
Lee, Jack C.; SpringerLink (Online service); Kim, Young-Hee.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/aut]