Wang, Laung-Terng.
概要
| 作品: | 1 作品在 0 項出版品 0 種語言 | |
|---|---|---|
書目資訊
System-on-chip test architectures = nanometer design for testability /
by:
ScienceDirect (Online service); Stroud, Charles E.; Touba, Nur A.; Wang, Laung-Terng.
(書目-語言資料,印刷品)
VLSI test principles and architectures = design for testability /
by:
Wu, Cheng-Wen, (EE Ph. D.); Wang, Laung-Terng.; Wen, Xiaoqing.
(書目-語言資料,印刷品)