Wang, Laung-Terng.
Overview
| Works: | 1 works in 0 publications in 0 languages | |
|---|---|---|
Titles
System-on-chip test architectures = nanometer design for testability /
by:
ScienceDirect (Online service); Stroud, Charles E.; Touba, Nur A.; Wang, Laung-Terng.
(Language materials, printed)
VLSI test principles and architectures = design for testability /
by:
Wu, Cheng-Wen, (EE Ph. D.); Wang, Laung-Terng.; Wen, Xiaoqing.
(Language materials, printed)
Subjects