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VLSI test principles and architectures = design for testability /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
VLSI test principles and architectures/ edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
其他題名:
design for testability /
其他作者:
Wang, Laung-Terng.
出版者:
Amsterdam ;Elsevier Morgan Kaufmann Publishers, : c2006.,
面頁冊數:
1 online resource (xxx, 777 p.) :ill. :
標題:
Integrated circuits - Very large scale integration -
電子資源:
http://www.sciencedirect.com/science/book/9780123705976
ISBN:
9780123705976
VLSI test principles and architectures = design for testability /
VLSI test principles and architectures
design for testability /[electronic resource] :edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - Amsterdam ;Elsevier Morgan Kaufmann Publishers,c2006. - 1 online resource (xxx, 777 p.) :ill. - The Morgan Kaufmann series in systems on silicon. - Morgan Kaufmann series in systems on silicon..
Includes bibliographical references and index.
ISBN: 9780123705976Subjects--Topical Terms:
655640
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / .V587 2006eb
Dewey Class. No.: 621.39/5
VLSI test principles and architectures = design for testability /
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