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Tan, Sheldon.

Overview
Works: 1 works in 0 publications in 0 languages
Titles
Long-Term Reliability of Nanometer VLSI Systems = Modeling, Analysis and Optimization / by: Kim, Taeyoung.; Tahoori, Mehdi.; Kiamehr, Saman.; Sun, Zeyu.; SpringerLink (Online service); Tan, Sheldon.; Wang, Shengcheng. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/aut]
 
 
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