Languages
Tan, Cher Ming.
Overview
| Works: | 1 works in 2 publications in 1 languages | |
|---|---|---|
Titles
Applications of finite element methods for reliability studies on ULSI interconnections
by:
SpringerLink (Online service); Tan, Cher Ming.
(Language materials, printed)
Electromigration modeling at circuit layout level
by:
SpringerLink (Online service); He, Feifei.; Tan, Cher Ming.
(Language materials, printed)
Theory and practice of quality and reliability engineering in Asia industry
by:
SpringerLink (Online service); Goh, Thong Ngee.; Tan, Cher Ming.
(Language materials, printed)
Subjects
Electronics and Microelectronics, Instrumentation.
Integrated circuits
Electrodiffusion
Quality Control, Reliability, Safety and Risk.
Partial Differential Equations.
Operations Management.
Electronic Circuits and Devices.
Quality control
Optical and Electronic Materials.
Computational Intelligence.
Atomic, Molecular, Optical and Plasma Physics.
Engineering.
Reliability (Engineering)
Engineering Economics, Organization, Logistics, Marketing.
Finite element method.