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Electromigration modeling at circuit...
~
He, Feifei.
Electromigration modeling at circuit layout level
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Electromigration modeling at circuit layout level/ by Cher Ming Tan, Feifei He.
作者:
Tan, Cher Ming.
其他作者:
He, Feifei.
出版者:
Singapore :Springer Singapore : : 2013.,
面頁冊數:
x, 103 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Integrated circuits - Reliability. -
電子資源:
http://dx.doi.org/10.1007/978-981-4451-21-5
ISBN:
9789814451215 (electronic bk.)
Electromigration modeling at circuit layout level
Tan, Cher Ming.
Electromigration modeling at circuit layout level
[electronic resource] /by Cher Ming Tan, Feifei He. - Singapore :Springer Singapore :2013. - x, 103 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology. Reliability,2191-530X. - SpringerBriefs in applied sciences and technology.Reliability..
ISBN: 9789814451215 (electronic bk.)Subjects--Topical Terms:
598323
Integrated circuits
--Reliability.
LC Class. No.: TK7874 / .T36 2013
Dewey Class. No.: 621.3815
Electromigration modeling at circuit layout level
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