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Egerton, R.F.

Overview

Works:	1 works in 2 publications in 1 languages

Titles

Electron energy-loss spectroscopy in the electron microscope by: SpringerLink (Online service); Egerton, R.F. (Language materials, printed)

Physical Principles of Electron Microscopy = An Introduction to TEM, SEM, and AEM / by: SpringerLink (Online service); Egerton, R.F. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/aut]

Physical principles of electron microscopy = an introduction to TEM, SEM, and AEM / by: Egerton, R.F.; SpringerLink (Online service) (Language materials, printed)

Subjects

Electron energy loss spectroscopy. Microscopy. Electron microscopy. Nanotechnology. Characterization and Evaluation of Materials. Spectroscopy. Spectroscopy and Microscopy. Solid State Physics. Biological Microscopy. Materials science. Spectroscopy/Spectrometry. Materials Science.

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