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Physical principles of electron microscopy = an introduction to TEM, SEM, and AEM /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Physical principles of electron microscopy/ by R.F. Egerton.
其他題名:	an introduction to TEM, SEM, and AEM /
作者:	Egerton, R.F.
出版者:	Cham :Springer International Publishing : : 2016.,
面頁冊數:	xi, 196 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Electron microscopy. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-39877-8
ISBN:	9783319398778

Physical principles of electron microscopy = an introduction to TEM, SEM, and AEM /
Egerton, R.F.

Physical principles of electron microscopyan introduction to TEM, SEM, and AEM /[electronic resource] :by R.F. Egerton. - 2nd ed. - Cham :Springer International Publishing :2016. - xi, 196 p. :ill., digital ;24 cm.

An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations.

This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.

ISBN: 9783319398778

Standard No.: 10.1007/978-3-319-39877-8doiSubjects--Topical Terms:

673459
Electron microscopy.

LC Class. No.: QH212.E4 / E354 2016

Dewey Class. No.: 502.825

Physical principles of electron microscopy = an introduction to TEM, SEM, and AEM /
LDR:02568nam a2200325 a 4500 001 865577
003 DE-He213
005 20161214154555.0
006 m d
007 cr nn 008maaau
008 170720s2016 gw s 0 eng d
020 $a 9783319398778 $q (electronic bk.)
020 $a 9783319398761 $q (paper)
024 7 $a 10.1007/978-3-319-39877-8 $2 doi
035 $a 978-3-319-39877-8
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.E4 $b E354 2016
072 7 $a TGMT $2 bicssc
072 7 $a TEC021000 $2 bisacsh
082 0 4 $a 502.825 $2 23
090 $a QH212.E4 $b E29 2016
100 1 $a Egerton, R.F. $3 786219
245 1 0 $a Physical principles of electron microscopy $h [electronic resource] : $b an introduction to TEM, SEM, and AEM / $c by R.F. Egerton.
250 $a 2nd ed.
260 $a Cham : $c 2016. $b Springer International Publishing : $b Imprint: Springer,
300 $a xi, 196 p. : $b ill., digital ; $c 24 cm.
505 0 $a An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations.
520 $a This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
650 0 $a Electron microscopy. $3 673459
650 1 4 $a Materials Science. $3 671087
650 2 4 $a Characterization and Evaluation of Materials. $3 674449
650 2 4 $a Spectroscopy and Microscopy. $3 768852
650 2 4 $a Biological Microscopy. $3 668791
650 2 4 $a Nanotechnology. $3 557660
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-39877-8
950 $a Chemistry and Materials Science (Springer-11644)