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Radiation Effects on Integrated Circuits and Systems for Space Applications

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Radiation Effects on Integrated Circuits and Systems for Space Applications/ edited by Raoul Velazco, Dale McMorrow, Jaime Estela.
其他作者:	Velazco, Raoul.
面頁冊數:	IX, 401 p. 192 illus., 141 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Electronic circuits. -
電子資源:	https://doi.org/10.1007/978-3-030-04660-6
ISBN:	9783030046606

Radiation Effects on Integrated Circuits and Systems for Space Applications
Radiation Effects on Integrated Circuits and Systems for Space Applications[electronic resource] /edited by Raoul Velazco, Dale McMorrow, Jaime Estela. - 1st ed. 2019. - IX, 401 p. 192 illus., 141 illus. in color.online resource.

Chapter1: Space and Radiation Environments -- Chapter2: System-Level Modeling and Analysis fo the Vulnerability of a Processor to SEU -- Chapter3: Single Event Effects Test Methods -- Chapter4: Characteristics and Applications of Pulsed-Laser-Induced Single-Event Effects -- Chapter5: Microprocessor Testing -- Chapter6: Fault Injection Methodologies -- Chapter7: Mitigation techniques and Error prediction applied in Multicore processors -- Chapter8: Improving reliability of multi/many-core processors by using NMR-MPar approach -- Chapter9: System Hardening and Real Applications -- Chapter10: Backward Error Recovery in SRAM based FPGA -- Chapter11: Development of a Hardened 150nm Standard Cell library -- Chapter12: COTS in Space: Constraints, Limitations and Disruptive Capability -- Chapter13: COTS & the NewSpace -- Chapter14: The Phoenix GPS Receiver for Rocket and Satellite Applications – An Example for the Successful Utilization of COTS Technology in Space Projects -- Chapter15: Simulation-based Radiation Hardness Assurance for ATHENA-WFI -- Chapter16: COTS for Deep Space Missions.

This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.

ISBN: 9783030046606

Standard No.: 10.1007/978-3-030-04660-6doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Radiation Effects on Integrated Circuits and Systems for Space Applications
LDR:04096nam a22003855i 4500 001 1004767
003 DE-He213
005 20200702010152.0
007 cr nn 008mamaa
008 210106s2019 gw | s |||| 0|eng d
020 $a 9783030046606 $9 978-3-030-04660-6
024 7 $a 10.1007/978-3-030-04660-6 $2 doi
035 $a 978-3-030-04660-6
050 4 $a TK7888.4
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
245 1 0 $a Radiation Effects on Integrated Circuits and Systems for Space Applications $h [electronic resource] / $c edited by Raoul Velazco, Dale McMorrow, Jaime Estela.
250 $a 1st ed. 2019.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2019.
300 $a IX, 401 p. 192 illus., 141 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Chapter1: Space and Radiation Environments -- Chapter2: System-Level Modeling and Analysis fo the Vulnerability of a Processor to SEU -- Chapter3: Single Event Effects Test Methods -- Chapter4: Characteristics and Applications of Pulsed-Laser-Induced Single-Event Effects -- Chapter5: Microprocessor Testing -- Chapter6: Fault Injection Methodologies -- Chapter7: Mitigation techniques and Error prediction applied in Multicore processors -- Chapter8: Improving reliability of multi/many-core processors by using NMR-MPar approach -- Chapter9: System Hardening and Real Applications -- Chapter10: Backward Error Recovery in SRAM based FPGA -- Chapter11: Development of a Hardened 150nm Standard Cell library -- Chapter12: COTS in Space: Constraints, Limitations and Disruptive Capability -- Chapter13: COTS & the NewSpace -- Chapter14: The Phoenix GPS Receiver for Rocket and Satellite Applications – An Example for the Successful Utilization of COTS Technology in Space Projects -- Chapter15: Simulation-based Radiation Hardness Assurance for ATHENA-WFI -- Chapter16: COTS for Deep Space Missions.
520 $a This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.
650 0 $a Electronic circuits. $3 563332
650 0 $a Signal processing. $3 561459
650 0 $a Image processing. $3 557495
650 0 $a Speech processing systems. $3 564428
650 0 $a Electronics. $3 596389
650 0 $a Microelectronics. $3 554956
650 1 4 $a Circuits and Systems. $3 670901
650 2 4 $a Signal, Image and Speech Processing. $3 670837
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
700 1 $a Velazco, Raoul. $e editor. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1298271
700 1 $a McMorrow, Dale. $e editor. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1298272
700 1 $a Estela, Jaime. $e editor. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1298273
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783030046590
776 0 8 $i Printed edition: $z 9783030046613
856 4 0 $u https://doi.org/10.1007/978-3-030-04660-6
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)